Monday, June 30, 2008

RFID Transponder, Inlay Perform in Industrial Environment

Texas Instruments introduces the 12 mm Multi-Usage Wedge Transponder and 24 mm LF Circular Inlay to deliver improved performance in highly metallic and harsh industrial environments. ...

TI RFID Transponder

... "The 12 mm Multi-Usage Wedge Transponder offers improvements in chip circuitry that enable direct-on-metal mounting. The 24 mm LF Circular Inlay, manufactured using TI's patented tuning process, provides improved consistency in read and write performance in applications such as waste management and industrial production. The tags incorporate a number of TI's patented RFID technology and quality innovations including half-duplex (HDX) radio communication. HDX boosts read range by 50 percent compared with full-duplex (FDX) LF and offers a stronger RF signal because the HDX reader shuts down during the HDX tag's response. This allows the HDX reader to concentrate on receiving the signal thereby obtaining an accurate read as compared to FDX. In FDX systems, the reader signal remains on and may create RF interference as it attempts to read the FDX tag. HDX also features frequency shift keying technology which makes TI's tags more immune to electromagnetic interference (EMI) and other ambient environmental noise, allowing the reader to effectively read and differentiate tags that are close together. " ...


Via TI: RFID Asset Visibility in Harsh and Metallic Environments

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Tuesday, May 06, 2008

RFID Test Measurement

New test method enables rapid testing of multiple RFID tags, so that new antenna designs can be evaluated and commercialized. Research was conducted at Georgia Institute of Technology. ...

... "Each antenna signal can then be separated from the others, allowing his team to simultaneously measure the signals from multiple tags. Their experiments have shown they can measure the power strength and phase of up to 256 antennas in the field of view ... " ...


Via Science Daily: RFID Testbed Measures Multiple Tags

Georgia Tech Research Institute, RFID: "Dr. Joseph Dalton heads GTI's RFID program. "

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